Impact of Morphological Features on the Dielectric Breakdown at SiO2/3C-SiC Interfaces

Conference Paper

Publication Date:

2010

Iris type:

04.01 Contributo in Atti di convegno

List of contributors:

Fiorenza, Patrick; Eriksson, GUSTAV JENS PETER; Raineri, Vito; Roccaforte, Fabrizio; Giannazzo, Filippo

Authors of the University:

FIORENZA PATRICK

GIANNAZZO FILIPPO

ROCCAFORTE FABRIZIO

Handle:

https://iris.cnr.it/handle/20.500.14243/70156