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Two-Dimensional Simulation of Undermask Penetration in 4H-SiC Implanted With Al+ Ions

Academic Article
Publication Date:
2011
Iris type:
01.01 Articolo in rivista
Keywords:
simulazione di processo; impiantazione ionica; impiacarburo di silicio; channeling
List of contributors:
Lulli, Giorgio
Handle:
https://iris.cnr.it/handle/20.500.14243/50621
Published in:
IEEE TRANSACTIONS ON ELECTRON DEVICES
Journal
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