Data di Pubblicazione:
2010
Abstract:
P-doped Si nanocrystals (radius <= 2 nm) were synthesized by depositing an ultrathin (0.3 nm) P-SiO2 film close to each SiO layer of SiO/SiO2 multilayers. During annealing P atoms migrate into the Si-rich region. Due to the low diffusivity of P in SiO2, P atoms segregate in the Si nanocrystal region and are incorporated in the silicon nanostructures. The P level in the Si nanoclusters can be controlled by changing the P content in the P-SiO2 layer.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Perego, Michele; Fanciulli, Marco
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