Data di Pubblicazione:
1995
Abstract:
When in a powder diffraction pattern two or more peaks heavily overlap, the integrated intensities of the overlapping reflections are correlated. This paper describes a method, based on the study of the peak overlap, which estimates the number of statistically independent intensities associated with a powder diagram. Such a number can be useful for forecasting the rate of success of direct-methods procedures for ab initio crystal structure solution and for evaluating a priori the efficiency of least-squares programs devoted to crystal structure refinement.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Guagliardi, Antonietta; Altomare, Angela; Moliterni, Anna; Cascarano, GIOVANNI LUCA
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