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A quasi-exact invertible equation for absorption coefficient from reflectance and transmittance measurements

Contributo in Atti di convegno
Data di Pubblicazione:
1993
Abstract:
Exact formulas describing reflectance and transmittance R and T of the system absorbing film%substrate%back ambient are examined. Basing on the consideration that, unlike R and T, the quantity T%(l-R) does not oscillate with wavelength, the entity of terms entering the full equation are evaluated, and some approximations are made. As a result, a non-oscillating analytical equation is obtained, that can be inverted and therefore utilized to compute the film absorption coefficient with an accuracy that is better than 3 %for ?>103cm-1. The effect of further approximations, like fixing the refractive index of the film and the substrate, is also evaluated. A comparison with a normally used, simplified formula, as well as an example of application, are also reported.
Tipologia CRIS:
04.01 Contributo in Atti di convegno
Elenco autori:
Summonte, Caterina
Autori di Ateneo:
SUMMONTE CATERINA
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/454246
Titolo del libro:
Amorphous Silicon Technology
Pubblicato in:
MRS PROCEEDINGS
Series
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http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=8174482
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