Data di Pubblicazione:
2009
Abstract:
Linear dichroism (LD) in x-ray absorption, diffraction, transport, and magnetization measurements on thin La0:7Sr0:3MnO3 films grown on different substrates, allow identification of a peculiar interface effect,
related just to the presence of the interface. We report the LD signature of preferential 3d - eg (3z2 - r2) occupation at the interface, suppressing the double exchange mechanism. This surface orbital reconstruction
is opposite to that favored by residual strain and is independent of dipolar fields, the chemical nature of the substrate and the presence of capping layers.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
orbital reconstruction; thin films; manganites; strain; interface
Elenco autori:
Balestrino, Giuseppe; Ghiringhelli, GIACOMO CLAUDIO; Tebano, Antonello; Braicovich, Lucio; Sanna, Samuele; Aruta, Carmela
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