Optical properties of C-Pd films prepared on silica substrate studied by UV-VIS-NIR spectroscopy

In this paper some optical properties of carbonaceous-palladium (C-Pd) thin films investigated using UV-VIS-NIR spectroscopy method are presented. Transmittance and reflectance spectra were measured in 200-3200 nm region. The shape of the spectra were depended on allotropic form of carbon (fullerene) matrix. The refractive coefficients and film thickness of studied materials has been determined based on Thin Film Interference and "envelope" methods. The optical band gap values were also estimated from absorption spectra using Tauc plot extrapolation. The results are in good agreement with experimental data obtained by spectroscopic ellipsometry.