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Charge dynamics of a single donor coupled to a few-electron quantum dot in silicon

Academic Article
Publication Date:
2012
abstract:
We report on the charge transfer dynamics between a silicon quantum dot and an individual phosphorous donor extracted from the current through the quantum dot as a probe for the donor ionization state. We employ a silicon n-metal-oxide-semiconductor field-effect transistor (MOSFET) with two side gates at a single metallization level to control both the device conductance and the donor charge. The elastic nature of the process is demonstrated by temperature and magnetic field independent tunneling times. The Fano factor approaches 1/2 revealing that the process is sub-poissonian.
Iris type:
01.01 Articolo in rivista
Keywords:
SPIN
List of contributors:
Guagliardo, Filippo; Ferrari, Giorgio; Fanciulli, Marco; Prati, Enrico; Belli, Matteo; Cocco, Simone
Authors of the University:
BELLI MATTEO
COCCO SIMONE
Handle:
https://iris.cnr.it/handle/20.500.14243/174770
Published in:
APPLIED PHYSICS LETTERS
Journal
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URL

http://apl.aip.org/resource/1/applab/v100/i21/p213107_s1
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