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Observation of Circular Dichroism in EELS

Contributo in Atti di convegno
Data di Pubblicazione:
2006
Abstract:
The similarities between XANES (X-ray Absorption Near Edge Structure) and ELNES allow to measure Linear Dichroism in the TEM. A similar task for Circular Dichroism which is routinely studied in synchrotrons was considered impossible with present technology. The possibility to detect chiral electronic transitions in the TEM was recently demonstrated [1, 2]. This makes ELNES in the TEM a strong competitor of the synchrotron for X-ray Magnetic Circular Dichroism (XMCD) studies (Fig. 1). In analogy to XMCD we introduced the term EMCD: Energy loss Magnetic Chiral Dichroism. in order to stress that no spin polarization of the beam is needed; rather, the chirality of transitions is detected in a particular scattering geometry.
Tipologia CRIS:
04.01 Contributo in Atti di convegno
Elenco autori:
Carlino, Elvio
Autori di Ateneo:
CARLINO ELVIO
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/9820
Titolo del libro:
Proceeding of JEELS 2006
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