MEASUREMENTS OF SURFACE-ROUGHNESS - USE OF A CCD CAMERA TO CORRELATE DOUBLY SCATTERED SPECKLE PATTERNS

We describe an instrument, built around a commercial CCD camera and some fast image-processing boards, that evaluates roughness height by measuring the average size of doubly scattered speckle patterns. The device is a variant of a recent proposal that was based on the use of a spatial modulator to perform the Fourier transform of a speckle image. In the present setup, the Fourier transform is replaced by the direct evaluation of a second-order correlation function. Strictly speaking, the device proposed in this paper is not a real-time device but its response time (approximately 10 s) is sufficiently short to be of practical value for many applications. Updated CCD cameras that will significantly improve the performance of our prototype are already on the market.