Characterization study of strained InGaAs/GaAs superlattices

Academic Article

Publication Date:

1994

Iris type:

01.01 Articolo in rivista

Keywords:

X-RAY DIFFRACTION; DEPTH RESOLUTION; XPS; MULTILAYER STRUCTURES; GAAS

List of contributors:

Kaciulis, Saulius; Viticoli, Sesto

Handle:

https://iris.cnr.it/handle/20.500.14243/176223

Published in:

JOURNAL OF APPLIED PHYSICS (ONLINE)

Journal