Publication Date:
2003
abstract:
Lanthanum cobaltite (LaCoO3) nanosystems were synthesised by an innovative combined use of the
chemical vapor deposition (CVD) and sol-gel (SG) routes. In particular, a lanthanum oxyfluoride
based layer was deposited by CVD on CoOx(OH)y SG substrates (xerogel). The subsequent thermal
treatment in air, between 400 and 900 °C, was aimed at promoting the solid-state reaction between
La-O and Co-O based layers, resulting in the complete formation of LaCoO3. The obtained samples
were analyzed by glancing incidence x-ray diffraction (GIXRD), transmission electron microscopy
(TEM), atomic force microscopy (AFM), secondary ion mass spectrometry (SIMS), x-ray
photoelectron (XPS) and x-ray excited Auger electron (XE-AES) spectroscopies, for a detailed
determination of their microstructure, chemical composition, and surface morphology. The present
work focuses on the XPS and XE-AES analysis of a selected lanthanum cobaltite (LaCoO3) thin
film, annealed at 700 °C for 2 h. Besides the wide scan spectrum, detailed spectra for the La 3d, Co
2p, Co LMM, O 1s, and C 1s regions and related data are presented and discussed. Both the
experimental Co 2p3/2-Co 2p1/2 energy splitting and the evaluation of the Auger parameter point out
to the formation of single-phase lanthanum cobaltite thin film. The presence of fluorine was never
detected, indicating its elimination after thermal treatment. Moreover, carbon contamination was
merely limited to the outermost sample layers.
Iris type:
01.01 Articolo in rivista
Keywords:
lanthanum cobaltite; CVD; sol-gel; XPS; nanosystems
List of contributors:
Armelao, Lidia; Barreca, Davide; Bottaro, Gregorio
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