Determination of the complex dielectric function of Si(111) 2 × 1, GaAs(110) and GaP(110) surfaces by polarized surface differential reflectivity
Academic Article
Publication Date:
1988
abstract:
We present a determination of the complex dielectric function of Si(111) 2 × 1, GaAs(110) and GaP(110) surfaces by using polarized Surface Differential Reflectivity technique. The effective number of electrons per atom participating in the optical transitions is calculated for energies up to 4.0 eV for each surface.
Iris type:
01.01 Articolo in rivista
List of contributors:
Cricenti, Antonio; Selci, Stefano
Published in: