Data di Pubblicazione:
2000
Abstract:
We have measured the temperature dependence of resistivity in relatively thick Nb/Al bilayers fabricated at room temperature, observing the decrease of p for increasing T typical of Anderson localization in disordered systems. We report the experimental conditions which determine this behavior and compare it to theoretical models for localization in 3D systems.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
superconductivity; thin films; bilayers; Nb; Al; localization; Anderson localization
Elenco autori:
Maggi, Sabino
Link alla scheda completa:
Pubblicato in: