A novel picture for charge transport interpretation in epitaxial manganite thin films

Transport characterizations of epitaxial La0.7Sr0.3MnO3 thin films in the thickness range 5 - 40 nm and 25 - 410 K temperature interval have been accurately collected. We show that taking into account polaronic effects allows to achieve the best ever fitting of the transport curves in the whole temperature range. The Current Carriers Density Collapse picture accurately accounts for the properties variation across the metal-insulator-transition. The electron-phonon coupling parameter \gamma estimations are in a good agreement with theoretical predictions. The results promote a clear and straightforward quantitative description of the manganite films involved in charge transport device applications.