Secondary-ion-mass spectrometry and high-resolution x-ray diffraction analyses of GaSb-AlGaSb heterostructures grown by molecular beam epitaxy
Articolo
Data di Pubblicazione:
2001
Abstract:
Secondary-ion-mass spectrometry and high-resolution x-ray diffraction are used Co investigate AlxGa1-xSb/GaSb heterostructures (0.2
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Giannini, Cinzia; DE CARO, Liberato
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