Compositional analysis of SmBa2Cu3O7-x films produced by laser ablation

The composition of SmBa2Cu3O7yx films deposited by pulsed laser ablation and deposition has been calculated by analyzing the particles-induced X-ray emission PIXE., Rutherford backscattering spectrometry RBS. and nuclear reaction analysis NRA. spectra. Data analysis of the RBS and NRA measurements gives an estimation of the thickness of the films. The resistance as a function of the temperature has been measured and discussed in relation to the off-stoichiometry of the films.