Publication Date:
2000
abstract:
The composition of SmBa2Cu3O7yx films deposited by pulsed laser ablation and deposition has been calculated by
analyzing the particles-induced X-ray emission PIXE., Rutherford backscattering spectrometry RBS. and nuclear reaction
analysis NRA. spectra. Data analysis of the RBS and NRA measurements gives an estimation of the thickness of the films.
The resistance as a function of the temperature has been measured and discussed in relation to the off-stoichiometry of the
films.
Iris type:
01.01 Articolo in rivista
List of contributors:
DI TROLIO, Antonio; Morone, Antonio
Published in: