THz characterization of painting layers

Contributo in Atti di convegno
Data di Pubblicazione:
2015
Abstract:
A THz Time Domain spectrometer was used to investigate painting layers in reflection geometry. The stratified layers were characterized and the refractive indexes were measured. The results were used for estimating the thicknesses of superimposed paint layers.
Tipologia CRIS:
04.01 Contributo in Atti di convegno
Keywords:
Painting layers; Refractive index; THz focusing lens; THz spectroscopy
Elenco autori:
Autori di Ateneo:
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/314863