Impact of Morphological Features on the Dielectric Breakdown at SiO2/3C-SiC Interfaces

Academic Article

Publication Date:

2010

Iris type:

01.01 Articolo in rivista

List of contributors:

Fiorenza, Patrick; Eriksson, GUSTAV JENS PETER; Weng, MING HUNG; Raineri, Vito; Roccaforte, Fabrizio; Giannazzo, Filippo

Authors of the University:

FIORENZA PATRICK

GIANNAZZO FILIPPO

ROCCAFORTE FABRIZIO

Handle:

https://iris.cnr.it/handle/20.500.14243/432121