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Multi-imaging analysis of nascent surface structures generated during femtosecond laser irradiation of silicon in high vacuum

Articolo
Data di Pubblicazione:
2018
Abstract:
We report a correlative imaging analysis of a crystalline silicon target after irradiation with a low number of 1055 nm, ~ 850 fs laser pulses with several microscopy techniques (e.g., scanning electron microscopy, atomic force microscopy, Raman micro-imaging and confocal optical microscopy). The analysis is carried out on samples irradiated both in high vacuum and at atmospheric pressure conditions, evidencing interesting differences induced by the ambient environment. In high-vacuum conditions, the results evidence the formation of a halo, which is constituted by alternate stripes of amorphous and crystalline silicon, around the nascent ablation crater. In air, such an effect is drastically reduced, due to the significant back-deposition of nanoparticulate material induced by the larger ambient pressure.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Ambient environment; Ambient pressures; Confocal optical microscopies; Crystalline silicons; High-vacuum conditions; Imaging analysis; Microscopy technique; Nano particulates
Elenco autori:
Amoruso, Salvatore; Bruzzese, Riccardo; JJ NIVAS, Jijil; Fittipaldi, Rosalba
Autori di Ateneo:
FITTIPALDI ROSALBA
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/343072
Pubblicato in:
APPLIED PHYSICS. A, MATERIALS SCIENCE & PROCESSING
Journal
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