Thermal Dynamics for Characterizing Nonlinear Circuit Behavior

In this paper, we focus on the thermal characterization of nonlinear electronic circuits deriving some conditions which suggest the existence of a relationship with the specific dynamic behavior shown by the circuit. A series of thermographic experiments indicate that the chaotic behavior in electronic circuits is associated with slower thermal transients, a slow linear growth of the temperature during the normal operating regime and lower overall temperature increase with respect to other dynamical regimes. Three experimental case studies are reported and discussed, considering also the effect of chaos control strategies.