Defect generation statistics in thin gate oxides

Academic Article

Publication Date:

2004

Iris type:

01.01 Articolo in rivista

List of contributors:

Lacaita, ANDREA L; Spinelli, LORENZO CLEMENTE

Handle:

https://iris.cnr.it/handle/20.500.14243/432014

Published in:

IEEE TRANSACTIONS ON ELECTRON DEVICES

Journal