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Integration of SnO2 sol-gel processes to gas sensor microfabrication: H-2 and CO sensitivity evaluation

Conference Paper
Publication Date:
1999
abstract:
Sol-gel organic synthesis of SnO2 thin films from tin ethoxide precursor is reported here as a promising and cheap alternative of the "classical" chemical and physical preparation methods of the SnO2 thin films, for gas sensing applications. A simple, integrated circuit compatible test structure, for rapid evaluation of the sensing properties of the SnO2 sol-gel derived thin films is described. The main features of our microstructure consist of a heating resistor integrated on chip, made of highly boron doped silicon and a metallisation system from Au/W deposited on a planarized chemically vapor deposited SiO2 layer. The SnO2 films have shown the well-known increase-maximum-decrease dependence of chemoresistance as a function of temperature, with a maximum at about 380 degrees C, when they are measured in clean, dry air. The sensitivity of SnO2 films to high concentration of H-2 in air (4500-16000 ppm) was studied within a quartz furnace, externally heated in the temperature range from 200 to 450 degrees C. The relative sensitivity is equal to 100% at temperatures as row as 200 degrees C, while its maximum value is anticipated to be above 450 degrees C. The CO sensing properties of SnO2 layers were evaluated as a function of input power applied on the integrated heating resistor. We have obtained relative sensitivities of 30% for 500 ppm CO concentration in dry air and an input power of 209 mW.
Iris type:
04.01 Contributo in Atti di convegno
Keywords:
sol-gel; SnO2 thin films; integrated circuit technology; integrated heating resistor
List of contributors:
Quaranta, Fabio; Capone, Simonetta; Rella, Roberto; Siciliano, PIETRO ALEARDO
Authors of the University:
CAPONE SIMONETTA
QUARANTA FABIO
RELLA ROBERTO
SICILIANO PIETRO ALEARDO
Handle:
https://iris.cnr.it/handle/20.500.14243/7842
Book title:
DESIGN, TEST, AND MICROFABRICATION OF MEMS AND MOEMS, PTS 1 AND 2
Published in:
PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
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