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Angle-Resolved XPS Contribution to the Elucidation of the Mechanism of Cathodic Deposition of As-Sb Alloys.

Articolo
Data di Pubblicazione:
1994
Abstract:
AsSb alloys were deposited electrochemically onto flat, smooth Ni-plated Cu sheets from aqueous citric acid solutions and analysed by X-ray photoelectron spectroscopy (XPS) and angle-resolved (AR) XPS. Samples prepared and manipulated in air showed marked surface oxidation of both alloy elements, present as As2O3 and Sb2O3. Oxide-free samples were obtained when electrochemical synthesis and transfer to the ultrahigh vacuum XPS chamber were carried out in an inert atmosphere. ARXPS analysis of oxide-free alloy samples obtained at large negative potential showed an increase in intensity of the As(2p3 2) peak at grazing take off angles. This result, showing As surface enrichment, supports a previously proposed kinetic model of AsSb alloy electrodeposition.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
THIN-FILMS; ELECTRODEPOSITION; ELECTROLYTES; LAYERS; GAAS
Elenco autori:
Musiani, Marco
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/7818
Pubblicato in:
JOURNAL OF ELECTROANALYTICAL CHEMISTRY (1992)
Journal
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http://www.sciencedirect.com/science/article/pii/0022072894033609
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