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INTERACTION OF AMBIENT GAS AND MENISCUS SURFACE DURING GROWTH OF EDGE-DEFINED FILM-FED GROWTH POLYCRYSTALLINE SILICON SAMPLES

Articolo
Data di Pubblicazione:
1991
Abstract:
We studied interaction of molten silicon at the meniscus surface with CO and CO2 gas added to an inert argon atmosphere during the growth of edge-defined film-fed growth polycrystalline silicon nonagons. Both gases caused a significant increase in carbon content of the nonagons. However, most carbon remained trapped in the layer close to the surface and made a SiC-like contribution to the infrared spectrum. In addition, CO2 gas caused enhanced surface oxidation (with respect to CO gas).
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
CZOCHRALSKI SILICON; SIC IMPURITIES; CARBON; OXYGEN; MELT; EFG; PRECIPITATION; COMPLEXES; RIBBONS; ORIGIN
Elenco autori:
Ottolini, Luisa
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/240436
Pubblicato in:
JOURNAL OF APPLIED PHYSICS (ONLINE)
Journal
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