Publication Date:
2011
abstract:
The effect of O implantation in crystalline Ge on the density of native point defects has been investigated through transmission electron microscopy and B diffusion experiments. Annealing at 650 degrees C following O implants produces a band of defects (similar to 5-10 nm), compatible with GeO2 nanoclusters (NCs). A clear shape transformation from elongated to spherical forms occurs within 2 h, concomitant with a transient enhanced diffusion of B. A large injection of self-interstitials from GeO2 NCs, giving a vacancy undersaturation, and a long-range migration of self-interstitials are evidenced and discussed.
Iris type:
01.01 Articolo in rivista
List of contributors:
Bruno, Elena; Carnera, Alberto; DE SALVADOR, Davide; Priolo, Francesco; Scapellato, GIORGIA GRAZIELLA; Boninelli, SIMONA MARIA CRISTINA; Spinella, ROSARIO CORRADO; Napolitani, Enrico; Mirabella, Salvatore
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