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Application of the high-resolution proton microprobe (micro-PIXE) for trace elements determination in silicate minerals.
Abstract
Publication Date:
2001
Iris type:
04.02 Abstract in Atti di convegno
Keywords:
micro-PIXE; Trace elements
List of contributors:
Olmi, Filippo; Vaggelli, Gloria
Authors of the University:
VAGGELLI GLORIA
Handle:
https://iris.cnr.it/handle/20.500.14243/419787
