Effects of surface roughness on sputter yield of Mo under keV D ion bombardment, experiment and SDTrimSP-3D simulations
Abstract
Publication Date:
2021
abstract:
An important issue in the development of thermonuclear fusion is the lifetime of the reactor inner wall. Bombardment by energetic
ions and neutrals from the plasma will lead to continuous erosion of the plasma-facing surface. Inside the plasma chamber of a
fusion device, particles coming from the plasma impinge on the components at different angles depending on both local plasma
parameters and on the orientation of the magnetic field lines. In the past, work has been done to study the effects of incidence
angle on sputter yields for smooth surfaces [1] and was expanded on model surfaces with well-defined periodicity of surface
roughness, which was around 25 nm [2]. However, to predict the erosion of components in the reactor first wall their surface
morphology needs to be taken in to account.
In this work the influence of surface roughness on the sputter yield of Mo under keV D ion bombardment was investigated. For
this purpose, thin films of Mo (~120 nm) were deposited by pulsed laser deposition onto graphite substrates with varying surface
roughness from 5 nm to 2-3 ?m. For samples with surface roughness of 2-3 ?m, we tried to imitate surface finish produced after
manufacturing. Samples were irradiated by 1 keV/D ions at different angles of incidence between 0° and 70° to D ion fluence in
the range of 1023 D/m2
. For all the surfaces, we observed a strong angular dependence of the sputter yield. For smooth and
intermediate surface roughnesses, up to Ra ~ 280 nm, we obtained an increase of the sputter yield with the angle up to a factor
of five compared to 0°. In contrast, for surface roughness of 2-3 ?m, the sputtering yield decreases with increasing impact angle.
The results served as validation of the Monte Carlo code SDTrimSP-3D [3]. We obtained good agreement between the simulated
and experimental sputter yield for surfaces for which we could provide high resolution atomic force microscopy (AFM) surface
representations. It turns out that SDTrimSP-3D code is sensitive on input data of sample surface morphologies. As high-resolution
surface mapping was not possible for surface roughness of 2-3 ?m, we found large deviation of calculation from the measured
data. Also the reasons and possible solutions will be discussed in detail together with possible extrapolations to lower ion energies
relevant for divertor conditions in a fusion device.
Iris type:
04.02 Abstract in Atti di convegno
Keywords:
surface roughness; sputter yield; Mo; keV D ion bombardment; SDTrimSP-3D simulations
List of contributors: