X-ray diffraction imaging provides nanometer spatial resolution for strain determination

This report presents x-ray waveguides as one-dimensional condenser lenses providing a source of submicron size for shadow projection and diffraction imaging techniques. A waveguide can compress an x-ray beam in one dimension to the level of 100 nm. This beam is spatially coherent. Consequently, the source size limited resolution in imaging experiments is expected to be at least the mentioned beam dimension.