Early detection of the metallization quality using moderately accelerated electromigration stress conditions
Conference Paper
Publication Date:
1998
Iris type:
04.01 Contributo in Atti di convegno
List of contributors:
Scorzoni, Andrea; Balboni, Roberto; Impronta, MAURIZIO PIO
Book title:
MATERIALS RELIABILITY IN MICROELECTRONICS VIII
Published in: