Electromagnetic field resonance in thin amorphous films: a tool for non-destructive localization of thin marker layers by use of a standard X-ray tube

Academic Article
Publication Date:
1996
Iris type:
01.01 Articolo in rivista
List of contributors:
Authors of the University:
Handle:
https://iris.cnr.it/handle/20.500.14243/201010
Published in:
THIN SOLID FILMS
Journal