Data di Pubblicazione:
2013
Abstract:
The evaporation mechanisms from a solid target in pulsed electron deposition (PED) technique
have been investigated by analysing the chemical composition and the thickness distribution of
CuGaSe2 (CGS) films grown at different discharge voltages on glass substrates. The behaviour
of the plasma plume generated from the target can be described by a linear combination of two
coexisting processes: incongruent thermal evaporation and congruent ablation, which exhibit
different weights depending on the PED voltage. The first component arises from the
thermodynamic liquid-to-vapour transition involving the very first layers of the target surface,
while the second one is due to the subsurface target penetration of the pulsed e-beam. The
chemical composition of the thermally evaporated cloud, according to the CuGaSe2 phase
diagram, exhibits an incongruent Cu depletion during the solid-to-gas phase transition with
respect to the target, thus forming the ordered vacancy compound CuGa3Se5, while the
sublimation of ablated species is perfectly stoichiometric. The thermally evaporated plasma
follows a typical surface source spatial distribution, while the expansion of the ablation
products exhibit a forward-peaked angular behaviour proportional to cosp ? (4 < p < 7). The
incongruent component becomes negligible by enhancing the discharge voltage, where the
e-beam is able to more deeply penetrate the target, and the electron power density exceeds the
threshold ablation value of 1×108 Wcm-2. The proposed mechanism for PED process is
compared to other models describing the plume generation in pulsed high-energy-induced
growth technique. This study represents a remarkable result to better understand and control
the PED process.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Surfaces; interfaces; thin films
Elenco autori:
Mezzadri, Francesco; Bronzoni, Matteo; Gilioli, Edmondo; Bissoli, Francesco; Rampino, Stefano; Pattini, Francesco
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