A SIMS and XPS study about ions influence on electrodeposited PbO2 films

XPS and SIMS investigation is presented on doped PbO2 electrodeposited on Ti under conditions in which the beta form of the oxide largely prevails. Complementary results obtained by XPS and SIMS analyses indicate that the doping species markedly affect the oxygen species accumulation on the oxide surface. In particular, metal cations added to electrodeposition bath are found to influence the F- incorporation in the surface region of PbO2 even if these foreign species are not detected in the coatings.