Degradation of organic light-emitting diode - art. no. 61922D

Ultra high vacuum operated prototypical organic light emitting diodes have been investigated by using chemically sensitive x-ray photoelectron microscopy. The mechanism of dark spot formation and degradation of organic light-emitting devices have been imaged and spectroscopically measured. The morphology and the chemical composition of the Al cathode reveal the formation of volcano like defects as a result of local micro-explosions. The chemical maps and micro-spot spectra identify a release of volatile In-, Sri- and C-containing species, including metallic In, supporting the evidence that the degradation process is driven by local decomposition of the ITO/organic interface.