Thermal Annealing Effects on Morphology and Electrical Response in Ultrathin Film Organic Transistors
Academic Article
Publication Date:
2004
abstract:
ltra-thin organic film transistors were annealed in vacuum at constant temperature and for different time intervals. This treatment eliminates unintentional doping and reduces hysteresis in I/V curves, both for pentacene and ?-sexithienyl, without substantially improving the charge mobility. Devices that originally exhibited high and non-ohmic contact resistance never matched the characteristics of devices with well grown electrode/semiconductor interfaces, even after annealing. Prolonging the annealing time resulted in film rupture due to either re-crystallization or molecular desorption. This process started before healing of molecular disorder at the relevant interfaces could take place.
Iris type:
01.01 Articolo in rivista
Keywords:
Organic; Transistors; Thermal annealing; AFM
List of contributors:
Biscarini, Fabio; Murgia, Mauro; Dinelli, Franco
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