Modelling of Electronic Devices using Radial Basis Functions for EMC Evaluation

In this paper a black-box identification technique based on the radial basis functions (RBF) is used in developing global dynamic behavioural models of electronic devices from measured transient responses. RBF allow to reproduce a non-linear dynamic model of the device under modelling (DUM) automatically taking into account all the physical effects relating input and output data, from measured waveform only: no knowledge of the internal structure is needed. Suitable parameters have to be evaluated by using selected voltage/current identification signals that allow to build up the global model of the DUM. The development of such global model constitutes the first step for electromagnetic compatibility (EMC) compliance in high performance electronic systems for information and communication technology and for industrial applications. In fact, due to the high complexity of such interconnected systems, EMC compliance can be obtained since the design stage only if the whole system is firstly scattered in low complexity sub-systems, opportunely modeled and then composed by the system physical interconnections to obtain the original apparatus. Global model is firstly obtained for logical I/O port and the validation is obtained by comparison with SPICE simulations. Original application related to single electronic component such as bipolar junction transistor is also reported and validated by comparing simulation results with measured data.