Support vector regression machines to evaluate resonant frequencies of elliptic substrate integrated waveguide resonators

In this paper an efficient technique for the determination of the resonances of elliptic Substrate Integrated Waveguide (SIW) resonators is presented. The method is based on the implementation of Support Vector Regression Machines trained using a fast algorithm for the computation of the resonant frequencies of SIW structures. Results for resonators with a wide range of parameters will be presented. A comparison with results obtained with Multi Layer Perceptron Artificial Neural Network and with full wave simulations will show the effectiveness of the proposed approach.