Data di Pubblicazione:
1989
Abstract:
We have studied two-dimensional and three-dimensional CoSi2 epitaxial layers on Si(111) by
polarization-dependent surface extended x-ray-absorption fine structure on the Co K edge (7707 eV).
The Co interface atoms are coordinated with eight Si atoms, as in bulk CoSi2, with an interface bond
length of 2.35(0.03) A. Ultrathin three-dimensional CoSi2 layers are 2.5% contracted in the direction
perpendicular to the interface.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
EXAFS; CoSi2; Si(111)
Elenco autori:
DE PADOVA, IRENE PAOLA
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