Data di Pubblicazione:
1996
Abstract:
The conduction band offset in ZnSe/GaAs n-p heterodiodes was determined from measurements of the low-temperature tunneling current of photoinjected carriers. We found widely different discontinuities for heterojunctions fabricated with different Zn/Se flux ratios, with conduction band offsets as high as 0.75 eV for Se-rich interfaces, and as low as 0.26 eV for Zn-rich interfaces.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Beltram, Fabio; Franciosi, Alfonso; Sorba, Lucia; Lazzarino, Marco; Rubini, Silvia; Pellegrini, Vittorio
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