Data di Pubblicazione:
2016
Abstract:
We analyzed the transient response of organic transistors by means of the deep-level transient spectroscopy technique. We showed how the current transient can be related to a mobility transient from which we estimated two different kinds of activation energies as well as information to the density of states.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Characterization techniques; current transients; deep-level transient spectroscopy (DLTS); mobility transients; organic Semiconductors; organic thin-film transistor
Elenco autori:
Quiroga, SANTIAGO DAVID; Natali, Marco; Benvenuti, Emilia; Muccini, Michele; Toffanin, Stefano
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