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Vanadium pentoxide thin films by XPS

Articolo
Data di Pubblicazione:
1999
Abstract:
Vanadium pentoxide thin films were grown on Al2O3 substrates by chemical vapor deposition and on glass substrates by plasma-enhanced chemical vapor deposition. While the films deposited on Al2O3 are polycrystalline, those grown on glass substrates show a strong (001) preferential orientation and are nanostructured. X-ray photoelectron spectroscopy measurements of the principal core levels for the surface of V2O5 films are reported.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
vanadium oxides; oxidation; photoelectron spectroscopy
Elenco autori:
Barreca, Davide
Autori di Ateneo:
BARRECA DAVIDE
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/6218
Pubblicato in:
SURFACE SCIENCE SPECTRA
Journal
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