Data di Pubblicazione:
1999
Abstract:
Vanadium pentoxide thin films were grown on Al2O3 substrates by chemical vapor deposition and
on glass substrates by plasma-enhanced chemical vapor deposition. While the films deposited on
Al2O3 are polycrystalline, those grown on glass substrates show a strong (001) preferential
orientation and are nanostructured. X-ray photoelectron spectroscopy measurements of the principal
core levels for the surface of V2O5 films are reported.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
vanadium oxides; oxidation; photoelectron spectroscopy
Elenco autori:
Barreca, Davide
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