X-ray characterization of LPE mercury cadmium telluride

X-ray topography and double crystal diffractometry investigations have been performed on Hg0.78Cd0.22Te epilayers grown on CdTe substrates by liquid phase epitaxy. Topographs showed only misfit dislocations and dislocation cellular arrangements. Double crystal rocking curves exhibited considerably narrower Bragg peak half-widths than previously reported; half-widths as small as 20 arc sec were indeed observed. These results demonstrate that the present epilayers are characterized by a very good crystal quality.