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Quantum dot strain engineering for light emission at 1.3, 1.4 and 1.5 µm

Articolo
Data di Pubblicazione:
2005
Abstract:
We designed and prepared by molecular beam epitaxy strain-engineered InAs/InGaAs/GaAs quantum dot (QD) nanostructures where we separately controlled: (i) the mismatch f between QDs and confining layers (CLs), and, then, the QD strain, by changing the thickness of a partially relaxed InGaAs lower CL and (ii) the CL composition x. The appropriate values of f and x to tune the emission energies at wavelengths in the 1.3-1.55 mu range were calculated by means of a simple model. Comparing model calculations and activation energies of photoluminescence quenching, we also concluded that quenching is due to both intrinsic and extrinsic processes; we show that the structures can be designed so as to maximize the activation energy of the intrinsic process, while keeping the emission energy at the intended value in the 1.3-1.55 mu range.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
semiconductor quantum dots; indium compounds; nanostructured materials; photoluminescence; molecular beam epitaxy
Elenco autori:
Allegri, Primo; Avanzini, Vincenzino; Franchi, Secondo; Frigeri, Paola; Seravalli, Luca
Autori di Ateneo:
FRIGERI PAOLA
SERAVALLI LUCA
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/53491
Pubblicato in:
APPLIED PHYSICS LETTERS
Journal
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URL

http://apl.aip.org/resource/1/applab/v87/i6/p063101_s1
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