Surface compositional gradients of InAs/GaAs quantum dots

With laterally resolved photoemission spectroscopy, we obtained In and Ga surface concentration maps of InAs/GaAs quantum dots. Our data demonstrate that the dot composition is neither pure InAs nor homogeneous InxGa1-xAs, but presents an In concentration increasing from the borders to the center of the dots. Besides, our observations suggest strong In segregation (x ~ 0.9) on the surface of the dots and of the surrounding wetting layer. Such segregation, well known for two-dimensional InAs/GaAs growth, had not been directly observed so far on the dots, and should be taken into account to model size and composition of GaAs-overgrown structures.