Data di Pubblicazione:
2012
Abstract:
The improvement of technologies towards a more
sustainable development and use of energy resources and
devices has received an increasing interest worldwide in
recent decades. There is consensus that this improvement
needs corroborating materials synthesis and device
fabrication processes with in-situ real-time characterization.
Elucidating the synthesis-processing-material-functionality
interplay is also a key issue in fundamental science,
necessary to advance basic knowledge of materials and to
manipulate their properties at the nanoscale. Therefore, this
contribution overviews how spectroscopic ellipsometry,
which is a non-destructive, nonintrusive, noninvasive, and
contactless optical technique, has evolved into an efficient
characterization tool for graphene-metal based hybrids for
plasmonics, optical sensors, and SERS devices. The scope of
this contribution is to highlight experimental achievements
obtained using real-time spectroscopic ellipsometry on the
CVD growth on nickel and copper substrates of graphene,
and its interactions with metals. Specifically, it will be shown
improvements in the properties of graphene achieved by
optimizing CVD growth and establishing correlations
between process kinetics and graphene thickness. It will also
be provided for the first time the direct evidence of the
tunability of the plasmon resonance of graphene coupled to
plasmonic metal nanoparticles (NPs). New opportunities for
the design of plasmonic graphene/metal (Ga, Au, Ag)
systems based on charge transfer are presented exploiting
the real time tailoring of the plasmon resonance by
spectroscopic ellipsometry. Charge transfer is crucial for
characterizing metal/graphene interfaces and understanding
plasmon-electron coupling across the materials components.
The role of graphene in the charge transfer, between the
metal NPs and the substrate, on the plasmon resonance
energy and amplitude is discussed and elucidated.
Tipologia CRIS:
04.02 Abstract in Atti di convegno
Elenco autori:
Losurdo, Maria
Link alla scheda completa:
Titolo del libro:
Abstracts book of E-MRS Fall Meeting