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Study of electrically active defects in GaAs/InAs/GaAs QDs structures by DLTS and TEM

Academic Article
Publication Date:
2006
Iris type:
01.01 Articolo in rivista
List of contributors:
Trevisi, Giovanna; Prezioso, Mirko; Seravalli, Luca; Franchi, Secondo; Gombia, Enos; Frigeri, Paola; Nasi, Lucia; Motta, Alberto; Mosca, Roberto
Authors of the University:
FRIGERI PAOLA
MOSCA ROBERTO
NASI LUCIA
SERAVALLI LUCA
TREVISI GIOVANNA
Handle:
https://iris.cnr.it/handle/20.500.14243/52746
Published in:
PROCEEDINGS OF THE IEEE
Journal
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