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Semiconductor Oxide Gas Sensors: Correlation between Conduction Mechanisms and Their Sensing Performances

Academic Article
Publication Date:
2021
abstract:
In this work, a variety of semiconducting oxides were prepared and principally characterized by means of spectroscopic techniques (absorbance FT-IR, diffuse reflectance UV-Vis-NIR) to shed light on the electronic properties and defects involved at the roots of gas sensing capabilities. The thick films were obtained by screen printing technology on which electrical characterization and gas sensing measurements were performed. From the cross analysis of the results, a description of the specific sensing mechanism for each material is proposed.
Iris type:
01.01 Articolo in rivista
Keywords:
thick film gas sensors; nanostructured semiconductor oxides; UV-Vis-NIR and FT-IR spectroscopies; electrical characterization; sensing mechanisms
List of contributors:
Carotta, MARIA CRISTINA; Fioravanti, Ambra
Authors of the University:
FIORAVANTI AMBRA
Handle:
https://iris.cnr.it/handle/20.500.14243/448220
Published in:
PROCEEDINGS (MDPI)
Journal
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URL

https://www.mdpi.com/2673-4583/5/1/71
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