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Simulation of space charge compensation in a multibeamlet negative ion beam

Articolo
Data di Pubblicazione:
2016
Abstract:
Ion beam space charge compensation occurs by cumulating in the beam potential well charges having opposite polarity, usually generated by collisional processes. In this paper we investigate the case of a H- ion beam drift, in a bi-dimensional approximation of the NIO1 (Negative Ion Optimization phase 1) negative ion source. H- beam ion transport and plasma formation are studied via particle-in-cell simulations. Differential cross sections are sampled to determine the velocity distribution of secondary particles generated by ionization of the residual gas (electrons and slow H2 + ions) or by stripping of the beam ions (electrons, H, and H+). The simulations include three beamlets of a horizontal section, so that multibeamlet space charge and secondary particle diffusion between separate generation regions are considered, and include a repeller grid biased at various potentials. Results show that after the beam space charge is effectively screened by the secondary plasma in about 3 ?s (in agreement with theoretical expectations), a plasma grows across the beamlets with a characteristic time three times longer, and a slight overcompensation of the electric potential is verified as expected in the case of negative ions.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Electric potential; Electric space charge; Ion sources; Ionization of gases; Negative ions; Plasma simulation; Beam space charge; Characteristic time; Collisional process; Differential cross section; Horizontal section; Particle-in-cell simulations; Secondary particles; Space charge compensation; Ion beams
Elenco autori:
Serianni, Gianluigi
Autori di Ateneo:
SERIANNI GIANLUIGI
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/309515
Pubblicato in:
REVIEW OF SCIENTIFIC INSTRUMENTS
Journal
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URL

http://scitation.aip.org/content/aip/journal/rsi/87/2/10.1063/1.4933252
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