Lattice strain analysis of VPE-grown ZnS epitaxial layers on (100)GaAs by RBS-channeling and high resolution XRD measurements

Academic Article
Publication Date:
1996
Iris type:
01.01 Articolo in rivista
List of contributors:
Authors of the University:
Handle:
https://iris.cnr.it/handle/20.500.14243/207395
Published in:
MATERIALS SCIENCE FORUM
Series